[TEST] Create a provision test using the noise diode
To ensure correct signal processing a end-to-end test is crucial. The EDD provides an API to write provision / end-to-end tests.
The test we need is a setup composed of digpackcontroller
-> ddc_processor
-> vdif_packer
whereas the digpackcontroller
sets the noise diode. In a post-processing step, the VDIF data is folded so that the higher power of the noise diode is visible in the first folded bin.