diff --git a/gui/tests/artifacts.js b/gui/tests/artifacts.js
index d8c45b6ba705524a681d453ea66aba0a3bd7857b..c52a98efaa04842cc07d869cdf4aa5803a8a473d 100644
--- a/gui/tests/artifacts.js
+++ b/gui/tests/artifacts.js
@@ -3689,7 +3689,7 @@ window.nomadArtifacts = {
},
"results.method.measurement.xrd.diffraction_method_name": {
"name": "diffraction_method_name",
- "description": "The diffraction method used to obtain the diffraction pattern.\n| X-Ray Diffraction Method | Description |\n|------------------------------------------------------------|-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------|\n| **Powder X-Ray Diffraction (PXRD)** | The term \"powder\" refers more to the random orientation of small crystallites than to the physical form of the sample. Can be used with non-powder samples if they present random crystallite orientations. |\n| **Single Crystal X-Ray Diffraction (SCXRD)** | Used for determining the atomic structure of a single crystal. |\n| **High-Resolution X-Ray Diffraction (HRXRD)** | A technique typically used for detailed characterization of epitaxial thin films using precise diffraction measurements. |\n| **Small-Angle X-Ray Scattering (SAXS)** | Used for studying nanostructures in the size range of 1-100 nm. Provides information on particle size, shape, and distribution. |\n| **X-Ray Reflectivity (XRR)** | Used to study thin film layers, interfaces, and multilayers. Provides info on film thickness, density, and roughness. |\n| **Grazing Incidence X-Ray Diffraction (GIXRD)** | Primarily used for the analysis of thin films with the incident beam at a fixed shallow angle. |",
+ "description": "The diffraction method used to obtain the diffraction pattern.\n| X-Ray Diffraction Method | Description |\n|------------------------------------------------------------|-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------|\n| **Powder X-Ray Diffraction (PXRD)** | The term \"powder\" refers more to the random orientation of small crystallites than to the physical form of the sample. Can be used with non-powder samples if they present random crystallite orientations. |\n| **Single Crystal X-Ray Diffraction (SCXRD)** | Used for determining the atomic structure of a single crystal. |\n| **High-Resolution X-Ray Diffraction (HRXRD)** | A technique typically used for detailed characterization of epitaxial thin films using precise diffraction measurements. |\n| **Small-Angle X-Ray Scattering (SAXS)** | Used for studying nanostructures in the size range of 1-100 nm. Provides information on particle size, shape, and distribution. |\n| **X-Ray Reflectivity (XRR)** | Used to study thin film layers, interfaces, and multilayers. Provides info on film thickness, density, and roughness. |\n| **Grazing Incidence X-Ray Diffraction (GIXRD)** | Primarily used for the analysis of thin films with the incident beam at a fixed shallow angle. |\n| **Reciprocal Space Mapping (RSM)** | High-resolution XRD method to measure diffracted intensity in a 2-dimensional region of reciprocal space. Provides information about the real-structure (lattice mismatch, domain structure, stress and defects) in single-crystalline and epitaxial samples.|",
"type": {
"type_kind": "Enum",
"type_data": [
@@ -3699,6 +3699,7 @@ window.nomadArtifacts = {
"Small-Angle X-Ray Scattering (SAXS)",
"X-Ray Reflectivity (XRR)",
"Grazing Incidence X-Ray Diffraction (GIXRD)",
+ "Reciprocal Space Mapping (RSM)",
"unavailable"
]
},
@@ -35768,7 +35769,7 @@ window.nomadArtifacts = {
]
},
"name": "diffraction_method_name",
- "description": "The diffraction method used to obtain the diffraction pattern.\n| X-Ray Diffraction Method | Description |\n|------------------------------------------------------------|-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------|\n| **Powder X-Ray Diffraction (PXRD)** | The term \"powder\" refers more to the random orientation of small crystallites than to the physical form of the sample. Can be used with non-powder samples if they present random crystallite orientations. |\n| **Single Crystal X-Ray Diffraction (SCXRD)** | Used for determining the atomic structure of a single crystal. |\n| **High-Resolution X-Ray Diffraction (HRXRD)** | A technique typically used for detailed characterization of epitaxial thin films using precise diffraction measurements. |\n| **Small-Angle X-Ray Scattering (SAXS)** | Used for studying nanostructures in the size range of 1-100 nm. Provides information on particle size, shape, and distribution. |\n| **X-Ray Reflectivity (XRR)** | Used to study thin film layers, interfaces, and multilayers. Provides info on film thickness, density, and roughness. |\n| **Grazing Incidence X-Ray Diffraction (GIXRD)** | Primarily used for the analysis of thin films with the incident beam at a fixed shallow angle. |",
+ "description": "The diffraction method used to obtain the diffraction pattern.\n| X-Ray Diffraction Method | Description |\n|------------------------------------------------------------|-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------|\n| **Powder X-Ray Diffraction (PXRD)** | The term \"powder\" refers more to the random orientation of small crystallites than to the physical form of the sample. Can be used with non-powder samples if they present random crystallite orientations. |\n| **Single Crystal X-Ray Diffraction (SCXRD)** | Used for determining the atomic structure of a single crystal. |\n| **High-Resolution X-Ray Diffraction (HRXRD)** | A technique typically used for detailed characterization of epitaxial thin films using precise diffraction measurements. |\n| **Small-Angle X-Ray Scattering (SAXS)** | Used for studying nanostructures in the size range of 1-100 nm. Provides information on particle size, shape, and distribution. |\n| **X-Ray Reflectivity (XRR)** | Used to study thin film layers, interfaces, and multilayers. Provides info on film thickness, density, and roughness. |\n| **Grazing Incidence X-Ray Diffraction (GIXRD)** | Primarily used for the analysis of thin films with the incident beam at a fixed shallow angle. |\n| **Reciprocal Space Mapping (RSM)** | High-resolution XRD method to measure diffracted intensity in a 2-dimensional region of reciprocal space. Provides information about the real-structure (lattice mismatch, domain structure, stress and defects) in single-crystalline and epitaxial samples.|",
"type": {
"type_kind": "Enum",
"type_data": [
@@ -35778,6 +35779,7 @@ window.nomadArtifacts = {
"Small-Angle X-Ray Scattering (SAXS)",
"X-Ray Reflectivity (XRR)",
"Grazing Incidence X-Ray Diffraction (GIXRD)",
+ "Reciprocal Space Mapping (RSM)",
"unavailable"
]
}
diff --git a/nomad/datamodel/results.py b/nomad/datamodel/results.py
index 9d3de6b76e10b94f58d359a6dce22cfab512fa83..c7abafac100ced82cb840a192a4a86ac52995a08 100644
--- a/nomad/datamodel/results.py
+++ b/nomad/datamodel/results.py
@@ -2118,6 +2118,7 @@ class XRDMethod(MSection):
'Small-Angle X-Ray Scattering (SAXS)',
'X-Ray Reflectivity (XRR)',
'Grazing Incidence X-Ray Diffraction (GIXRD)',
+ 'Reciprocal Space Mapping (RSM)',
config.services.unavailable_value,
]
),
@@ -2131,6 +2132,7 @@ class XRDMethod(MSection):
| **Small-Angle X-Ray Scattering (SAXS)** | Used for studying nanostructures in the size range of 1-100 nm. Provides information on particle size, shape, and distribution. |
| **X-Ray Reflectivity (XRR)** | Used to study thin film layers, interfaces, and multilayers. Provides info on film thickness, density, and roughness. |
| **Grazing Incidence X-Ray Diffraction (GIXRD)** | Primarily used for the analysis of thin films with the incident beam at a fixed shallow angle. |
+ | **Reciprocal Space Mapping (RSM)** | High-resolution XRD method to measure diffracted intensity in a 2-dimensional region of reciprocal space. Provides information about the real-structure (lattice mismatch, domain structure, stress and defects) in single-crystalline and epitaxial samples.|
""",
a_elasticsearch=[
Elasticsearch(material_entry_type),